CCD Spectroradiometer Integrating Sphere Compact System
LPCE-3 is a CCD Spectroradiometer Integrating Sphere Compact System for LED Testing. It is suitable for single LED and LED luminaires' photometric, colorimetric and electrical measurement. The measured data meets the requirements of CIE 177, CIE84, CIE-13.3, COMMISSION DELEGATED REGULATION (EU) 2019/2015, IES LM-79-19, Optical-Engineering-49-3-033602, IESNA LM-63-2, ANSI-C78.377 and GB standards
The Sphere System Configuration:
CCD Spectroradiometer (LMS-7000), Optical Fiber (CFO-1.5M), Digital Power Meter (LS2008R), DC Power Source (DC-S Series), AC Power Source (LSP-500VAS), Integrating Sphere (IS-1.5MA-CASE and IS-0.3M), Standard Light Source (SLS-50W and SLS-10W)
Measurement:
• Colorimetric: Chromaticity coordinates, CCT, Color Ratio, Peak Wavelength, Half Bandwidth, Dominant Wavelength, Color Purity, CRI (Ra, R1 to R15), Spectrum Test, TM30 (Rf, Rg), CQS
• Photometric: Luminous Flux, Luminous Efficiency, Radiant Power, EEI, PAR, PPF
• Electrical: Voltage, Current, Power, Power Factor, Harmonic (Optional)
Specification:
• Spectral Range Wavelength: 350nm~950nm(LMS-7000VIS) (200~1050nm is optional)
• Spectral Wavelength Accuracy: ±0.5nm Wavelength Reproducibility: ±0.5nm
• Sample Scanning Steps: ±0.1nm
• Accuracy of Chromaticity Coordinate (Δx, Δy): ±0.003 (under Standard A Lamp)
• Correlated Color Temperature CCT: 1,500K~25,000K. CCT Accuracy: ±0.5%
• Color Rendering Index Range: 0~100.0, Accuracy: ± (0.3%rd±0.3)
• Photometric linear: ±0.5%
• Stray light: <0.015% (600nm) and <0.03% (435nm)<br />
• The system includes the auxiliary lamp device and the software includes self-absorption function
• Connect with PC via USB cable. The English version software can run in Win7, Win8, Win10, Win11 (The driver was Certificated by Microsoft)
Personne à contacter : He Rachel, +15 3 17 38 39 97
Bonne affaire : acheter au vendeur
Nous vous invitons à lire nos conditions générales d'utilisations. Vous pouvez aussi vous rendre sur nos FAQ et consulter notre page d'informations sur les risques liés à la contrefaçon.
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